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E-Field Probe System EFS-105

It is now possible to accurately measure noise in semiconductors, high-density printed circuit boards, components, and modules, which have had many challenges in measurement methods until now.

Features: ★ 1D E-field probe ★ Ultra-small probe head ★ Fiber optic connection ★ Optical power supply – no battery required ★ Wide bandwidth: 500KHz to 3GHz ★ Dynamic range: typ. 130dB (1Hz) ★ Low noise: typ. <10μV/(m×√Hz) @ 200 to 500MHz typ. <30μV/(m×√Hz) @ 5MHz to 3GHz